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Abstract
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Article Information:
Enhanced Test Data Compression of Conflict Bit Using Clustering Technique
S. Saravanan and Har Narayan Upadhyay
Corresponding Author: S. Saravanan
Submitted: March 23, 2012
Accepted: April 14, 2012
Published: November 15, 2012 |
Abstract:
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The aim of this study is to implement enhanced test data compression of conflict bit using clustering
technique. Huge test patterns, larger power consumption and more accessing time are the various challenges
encountered by present System on Chip (SOC) design. Various compression techniques have been developed
to minimize the huge test patterns by reducing the size of the data which saves space and transmission time.
Test quality of the test pattern can be improved by test data compression. By finding the proper conflict bit
(‘U’) the proposed algorithm generates test patterns having high reduction in test compression. Small numbers
of test patterns are generated using clustering technique. With proper test pattern clustering it is possible to
achieve high level of compression. Validation of the proposed method is found by experimental results on
ISCAS’89 and shows that compression ratio is achieved by 79% with less conflict test pattern.
Key words: Compression , conflict bit, test pattern clustering, , , ,
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Cite this Reference:
S. Saravanan and Har Narayan Upadhyay, . Enhanced Test Data Compression of Conflict Bit Using Clustering Technique. Research Journal of Applied Sciences, Engineering and Technology, (22): 4674-4677.
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ISSN (Online): 2040-7467
ISSN (Print): 2040-7459 |
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