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Abstract
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Article Information:
Effects on the Forward Bias Characteristics of Neutron Irradiated Si and GaAs Diodes
N.I. Che Omar, N.K. Alang Md Rashid, J. Abdullah, J. Abdul Karim and N.F. Hasbullah
Corresponding Author: N.F. Hasbullah
Submitted: March 31, 2012
Accepted: April 23, 2012
Published: December 01, 2012 |
Abstract:
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The aim of this study is to investigate the effects on forward bias characteristics of neutron radiation
on various commercially available silicon and GaAs diodes. The diodes were irradiated using the Pneumatic
Transfer System (PTS) facility in Malaysian Nuclear Agency with neutron fluences up to 1012 neutron/cm2.s
for an exposure time of 1, 3 and 5 min. The Forward Bias (FB) current-voltage (I-V) characteristics and doping
profiles of the diodes were recorded before and after irradiation. It is observed that the FB leakage current of
the silicon and GaAs diodes increases after irradiation. The increase in leakage current is interpreted as being
due to an increase of generation-recombination traps created in the band gap after radiation. The doping
concentration of GaAs diodes in FB is observed to decrease while the series resistance increases after
irradiation which may be attributed to changes in doping concentration due to carrier removal by the defects
produced.
Key words: Commercial diode , doping concentration, electrical characterization, ideality factor, leakage current, neutron radiation,
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Abstract
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Cite this Reference:
N.I. Che Omar, N.K. Alang Md Rashid, J. Abdullah, J. Abdul Karim and N.F. Hasbullah, . Effects on the Forward Bias Characteristics of Neutron Irradiated Si and GaAs Diodes. Research Journal of Applied Sciences, Engineering and Technology, (23): 5079-5083.
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ISSN (Online): 2040-7467
ISSN (Print): 2040-7459 |
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