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    Abstract
2013 (Vol. 5, Issue: 24)
Article Information:

Testable Subsystems Generation for Fault Detection and Isolation Using a Structural Matching Rank Algorithm Testability of an Electrical Circuit

Alem Sad, Mokhtari Hicham, Ouziala Mahdi and Benazzouz Djamel
Corresponding Author:  Alem Sad 

Key words:  Testable subsystems, Structural Analysis, Bipartite graph, Analytic Redundancy Relations ARR, Fault Detection and Isolation FDI, ,
Vol. 5 , (24): 5657-5664
Submitted Accepted Published
December 12, 2012 January 21, 2013 May 30, 2013
Abstract:

In this study, an advanced way of dealing with testable subsystems and residual generation for fault detection and isolation based on structural analysis is presented. The developed technique considers execution issues; therefore, it has a more realistic point of view compared to classical structural approaches available in the literature. First, theoretical aspects of structural analysis are considered and introduced. Then the way of incorporating them to test the structural proprieties is explained. Finally, we show how the proposed (upgraded) matching rank algorithm can be used in order to choose the most suited matching that leads to computational sequences and detection tests. The method is demonstrated using an electrical circuit.
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  Cite this Reference:
Alem Sad, Mokhtari Hicham, Ouziala Mahdi and Benazzouz Djamel, 2013. Testable Subsystems Generation for Fault Detection and Isolation Using a Structural Matching Rank Algorithm Testability of an Electrical Circuit.  Research Journal of Applied Sciences, Engineering and Technology, 5(24): 5657-5664.
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ISSN (Online):  2040-7467
ISSN (Print):   2040-7459
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