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2013 (Vol. 6, Issue: 20)
Article Information:

Study on a New Character of Chaotic States to a Nonlinear Measure Model: Pseudo Temperature

Huiz-Hong Cheng and Xie-Feng Cheng
Corresponding Author:  Huiz-Hong Cheng 

Key words:  Chaotic, nonlinear circuit, probability density, Pseudo temperature, , ,
Vol. 6 , (20): 3767-3771
Submitted Accepted Published
January 10, 2013 March 02, 2013 November 10, 2013
Abstract:

Chaos is ubiquitous and extremely complicated phenomenon in the decision of nonlinear systems. Bifurcations of periodic, quasi-periodic and chaotic oscillations are frequently observed in forced nonlinear circuits described by no autonomous differential equations with a periodic external forcing term. Qualitative analysis using the Poincare mapping is commonly applied in the study of bifurcation phenomena as well as in numerical analysis of periodic and non-periodic solutions. In the measurement of electronics, electrical engineering, when the measurement object is nonlinear, the results of measurement may occur as chaotic state. The study used the nonlinear circuit as the measure model, studies probability density of "Pseudo-Temperature", which can be used to represent the degree of chaotic states and provides a new way of quantitative analysis to chaotic states of the nonlinear measure system. The experiment results show Pseudo-Temperature is new characteristic parameters, it can measure wide-area information from the normal to the randomness in the chaotic state.
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  Cite this Reference:
Huiz-Hong Cheng and Xie-Feng Cheng, 2013. Study on a New Character of Chaotic States to a Nonlinear Measure Model: Pseudo Temperature.  Research Journal of Applied Sciences, Engineering and Technology, 6(20): 3767-3771.
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ISSN (Online):  2040-7467
ISSN (Print):   2040-7459
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