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    Abstract
2014 (Vol. 7, Issue: 6)
Article Information:

Investigating a Hypothetical Semiconductor Laser Bar Using a Laser Diode Simulation/Emulation Tool Using Random Levels of Defects

C.K. Amuzuvi and J.C. Attachie
Corresponding Author:  C.K. Amuzuvi 

Key words:  Band gap energy, by-emitter, defect, degradation, emitter, nonradiative recombination, quantum well, slope efficiency, temperature, threshold current
Vol. 7 , (6): 1145-1148
Submitted Accepted Published
February 21, 2013 April 02, 2013 February 15, 2014
Abstract:

In this study, Barlase, a semiconductor laser diode emulation tool, is used to emulate the by-emitter degradation of high power semiconductor laser diodes. Barlase is a software that uses a LabView control interface. We have demonstrated how Barlase works using a hypothetical laser diode bar (multiple emitters) to validate the usefulness of the tool. A scenario using the hypothetical bar was investigated to demonstrate Barlase as follows: random low-level of defects distributed across the bar. The results of the simulation show the successful implementation of Barlase in the by-emitter analysis of laser diodes.
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  Cite this Reference:
C.K. Amuzuvi and J.C. Attachie, 2014. Investigating a Hypothetical Semiconductor Laser Bar Using a Laser Diode Simulation/Emulation Tool Using Random Levels of Defects.  Research Journal of Applied Sciences, Engineering and Technology, 7(6): 1145-1148.
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ISSN (Online):  2040-7467
ISSN (Print):   2040-7459
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