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    Abstract
2014 (Vol. 7, Issue: 8)
Article Information:

Investigating a Hypothetical Semiconductor Laser Bar with a Damaged Single Emitter Using a Laser Diode Simulation/Emulation Tool

C.K. Amuzuvi and J.C. Attachie
Corresponding Author:  C.K. Amuzuvi 

Key words:  Band gap energy, by-emitter, defect, degradation, emitter, nonradiative recombination , quantum well, slope efficiency, temperature, threshold current
Vol. 7 , (8): 1598-1602
Submitted Accepted Published
May 21, 2013 June 12, 2013 February 27, 2014
Abstract:

This study demonstrates the use of Barlase, a semiconductor laser diode emulation tool, to emulate the by-emitter degradation of high power semiconductor laser diodes.Barlase is software that uses a LabView control interface. In this study, a hypothetical laser diode bar (multiple emitters) was used to investigate a damaged single emitter randomly located in the bar and its behavior analyzed within the bar. It should however, be noted that, this scenario is valid for devices at the start of the aging process only. When all other relevant effects that affect the performance of laser diodes bars are allowed to interact over time, high levels of defects can also play important role in the degradation process. The results of this simulation scenario show the successful implementation of Barlase in the by-emitter analysis of laser diodes.
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  Cite this Reference:
C.K. Amuzuvi and J.C. Attachie, 2014. Investigating a Hypothetical Semiconductor Laser Bar with a Damaged Single Emitter Using a Laser Diode Simulation/Emulation Tool.  Research Journal of Applied Sciences, Engineering and Technology, 7(8): 1598-1602.
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ISSN (Online):  2040-7467
ISSN (Print):   2040-7459
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