Abstract

This study demonstrates the use of Barlase, a semiconductor laser diode emulation tool, to emulate the by-emitter degradation of high power semiconductor laser diodes. Barlase is software that uses a LabView control interface. In this study, a hypothetical laser diode bar (multiple emitters) was used to investigate a damaged single emitter randomly located in the bar and its behavior analyzed within the bar. It should however, be noted that, this scenario is valid for devices at the start of the aging process only. When all other relevant effects that affect the performance of laser diodes bars are allowed to interact over time, high levels of defects can also play important role in the degradation process. The results of this simulation scenario show the successful implementation of Barlase in the by-emitter analysis of laser diodes.

Keywords:

Band gap energy, by-emitter, defect, degradation, emitter, nonradiative recombination, quantum well, slope efficiency, temperature, threshold current,

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Competing interests

The authors have no competing interests.

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