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Abstract
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Article Information:
Cluster Based LFSR Reseeding for Test Data Compression
S. Saravanan, K. Chakrapani and P. Selvakumar
Corresponding Author: S. Saravanan
Submitted: February 09, 2012
Accepted: March 06, 2012
Published: July 15, 2012 |
Abstract:
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Today’s System-on-Chip (SoC) represent high-complexity and it is moving towards the challenge
of huge test patterns, more accessing time and larger power consumption. Test data compression is done to
improve the test quality. This study presents a test pattern compression by the usage of suitable clustering
technique and its corresponding decompression scheme. This scheme includes compression and decompression
achieved by LFSR reseeding. Test data compression is widely used in the industry nowadays to reduce the
amount of test data stored on the ATE and to decrease testing time. The proposed method requires no special
ATPG. The proposed method is validated by the simulation and synthesis output.
Key words: Clustering technique, LFSR reseeding, test data compression, , , ,
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Abstract
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Cite this Reference:
S. Saravanan, K. Chakrapani and P. Selvakumar, . Cluster Based LFSR Reseeding for Test Data Compression. Research Journal of Applied Sciences, Engineering and Technology, (14): 2120-2125.
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ISSN (Online): 2040-7467
ISSN (Print): 2040-7459 |
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