Research Article | OPEN ACCESS
1K.S. Neelukumari and 2Dr. K.B. Jayanthi
1K.S. Neelukumari and 2Dr. K.B. Jayanthi
1Department of Electronics and Communication Enginnering, P.A. College of Engineering and Technology, Pollachi
2Department of Electronics and Communication Enginnering, K.S. Rangasamy College of Technology, Namakkal, Tamilnadu, India
Research Journal of Applied Sciences, Engineering and Technology ` 2016 3:253-257
Received: January ‎23, ‎2015 | Accepted: May ‎28, ‎2015 | Published: February 05, 2016
Abstract
Power dissipation is a significant problem as complexity of the circuit increases, which also increases during testing the VLSI circuits. So test data volume and test application time are major concerns for large industrial circuits. Test set selection is necessary to ensure that the most effective patterns are chosen from large test set in a high volume testing environment. LFSR reseeding forms the basis for many test compression solution, which increase the encoding efficiency of test compression based on LFSR. The most important criteria is to optimize the patterns generated for Built In Self-Test (BIST) which maximize the fault coverage and reduce the number of transition in the scan chains. Efficient techniques for test generations are essential in order to reduce the test generation time and size. In this study the output deviation method is used to select the effective test pattern from a large n-detect test set for test data compression scheme. The experiments are performed on ISCAS ’85 benchmark circuits.
Keywords:
BIST, encoding algorithm, Linear Feedback Shift Register (LFSR),
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Competing interests
The authors have no competing interests.
Open Access Policy
This article is distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution, and reproduction in any medium, provided you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made.
Copyright
The authors have no competing interests.
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