Research Article | OPEN ACCESS
The Effect of Facet Heating and the Evolution with Aging
1, 2C.K. Amuzuvi and 1J.C. Attachie
1University of Mines and Technology, Department of Electrical and Electronic Engineering,
Tarkwa, Ghana
2Photonic and RF Engineering Group, Electrical Systems and Optics Research Division, Faculty of Engineering, University of Nottingham (UNott), Nottingham, NG7 2RD, U.K
Research Journal of Applied Sciences, Engineering and Technology 2013 3:361-365
Received: July 05, 2012 | Accepted: August 08, 2012 | Published: June 15, 2013
Abstract
This study seeks to explain the effects of thermal runaway due to current competition between emitters in a laser diode bar using both experimental and simulation results. We have demonstrated a trend due to temperature and the evolution with aging using both experimental and simulation results. By-emitter degradation analysis was performed on two bars: 650 nm broad area laser bars and 980 nm tapered laser bars before and after aging. We observed that, a frown shaped temperature profile gave rise to a corresponding frown shaped profile, but the frown shaped power profile turned to a smile shaped profile with the evolution of time. The observed trend was confirmed using simulation results.
Keywords:
Band gap energy, by-emitter, degradation, emitters, temperature,
Competing interests
The authors have no competing interests.
Open Access Policy
This article is distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution, and reproduction in any medium, provided you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made.
Copyright
The authors have no competing interests.
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ISSN (Online): 2040-7467
ISSN (Print): 2040-7459 |
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