Research Article | OPEN ACCESS
Performance Test and Evaluation for Pixel CdZnTe Detector of Different Thickness
1, 3Shen Min, 1Xiao Shali, 1Zhang Liuqiang, 2Cao Yulin and 2Chen Yuxiao
1Key Lab of Optoelectronic Technology and Systems, Ministry of Education,
Chongqing University, China
2Institute of Electronic Engineering, China Academy of Engineering Physics, Si Chuan, China
3ChongQing Technology and Business Institute, ChongQing, China
Research Journal of Applied Sciences, Engineering and Technology 2014 14:2868-2873
Received: February 06, 2013 | Accepted: March 02, 2013 | Published: April 12, 2014
Abstract
The aim of this study is to get the photon energy suitable for different thickness detector, different photon energy acts on pixel CdZnTe detector of different thickness. We can obtain the energy spectrum estimation, energy resolution and peak efficiency by the experiment and simulation with the radiation source of 241Am and 137Cs acting on pixel CdZnTe detector. From experiment results, it can be found that at the high energy of 662 keV the thicker the CdZnTe detector is, the higher the energy resolution and peak efficiency is while at the low energy of 59.5 keV tailing increases and charge is loss. It also can be found the characteristic of detector is better at the low energy when the detector thickness is thinner.
Keywords:
CdZnTe detector, energy resolution, light spectrum, peak efficiency,
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Competing interests
The authors have no competing interests.
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