Research Article | OPEN ACCESS
Multiple Optimal Solutions and Sag Occurrence Index Based Placement of Voltage Sag Monitors
1M.A. Ali, 1Manoj Fozdar, 1K.R. Niazi and 2A.R. Phadke
1Department of Electrcial Engineering, Malaviya National Institute of Technology, Jaipur,
Rajasthan 302017
2Department of Electrcial Engineering, Government Polytechnic Solapur, Maharashtra, India
Research Journal of Applied Sciences, Engineering and Technology 2014 18:3716-3724
Received: June 28, 2013 | Accepted: July 17, 2013 | Published: May 10, 2014
Abstract
This study presents optimal placement of voltage sag monitors based on new Sag Occurrence Index (SOI) which ensures observability even in case of monitor failure or line outages. Multiple solutions for optimal placement of voltage sag monitors for voltage sag detection have been obtained by genetic algorithm approach such that observability of the whole system is guaranteed. A new Sag Occurrence Index (SOI) is proposed to obtain the severity of voltage sag at all the buses in the system. To obtain the best monitor arrangement in the system, the sum of SOI for each optimal combination is determined. IEEE 24-bus Reliability Test System (RTS) and IEEE 57-bus system were used to demonstrate the effectiveness of the proposed method. The details of implementation and simulation results are also presented.
Keywords:
Multiple optimal solutions, power quality, Sag Occurrence Index (SOI), voltage sag, voltage sag monitoring,
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Competing interests
The authors have no competing interests.
Open Access Policy
This article is distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution, and reproduction in any medium, provided you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made.
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The authors have no competing interests.
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