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2012 (Vol. 4, Issue: 12)
Article Information:

An Innovative Test Data Compression Method Using Scan Chain Compaction

S. Sowmiyaa and D. Muralidharan
Corresponding Author:  D. Muralidharan 

Key words:  ATE, fault coverage, graph coloring, scan chain, test vector, ,
Vol. 4 , (12): 1790-1793
Submitted Accepted Published
February 02, 2012 February 22, 2012 June 15, 2012

Test data compression method is a key issue for reducing test data volume and test application time. Various techniques have been developed with great success on dealing with data compression. The previous schemes of compression techniques have been developed to reduce test data volume but the application time is not sufficiently reduced. Additional fault simulation and test generation are necessary to advice high fault coverage. The proposed Odd-Even Scan Network (OESN) provides the high compression ratio and the fast testing time. The compatible scan cell group is planned to implement and it will be integrated with the existing scan chain compaction. The experimental results on ISCAS-89 show that the proposed approach achieves high compression ratio.
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  Cite this Reference:
S. Sowmiyaa and D. Muralidharan, 2012. An Innovative Test Data Compression Method Using Scan Chain Compaction.  Research Journal of Applied Sciences, Engineering and Technology, 4(12): 1790-1793.
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ISSN (Online):  2040-7467
ISSN (Print):   2040-7459
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