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Abstract
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Article Information:
A Novel Approach for X-filling and Reordering Test Vectors for Power Reduction
C.R. Supreta Devi and K.A. Venkatraman and D. Muralidharan
Corresponding Author: D. Muralidharan
Submitted: February 02, 2012
Accepted: March 06, 2012
Published: June 15, 2012 |
Abstract:
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Optimization of testing power is a significant task to be carried out in digital circuit design. During
testing, the power dissipation will be high due to very high number of toggles between test vectors. Hence
power minimization is significant during testing. X bits in the test vectors are identified and then X bits are
replaced with their appropriate values. The filled vector set is next reordered. In this study, Kruskal based
approach is proposed for reordering the vector to minimize the number of toggles and hence power
consumption. It is experimented with ISCAS89 benchmark circuits, generated from MINTEST to validate our
study.
Key words: Peak power, reordering, switching activity, TSP, X-filling, X-identification,
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Cite this Reference:
C.R. Supreta Devi and K.A. Venkatraman and D. Muralidharan, . A Novel Approach for X-filling and Reordering Test Vectors for Power Reduction. Research Journal of Applied Sciences, Engineering and Technology, (12): 1801-1804.
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ISSN (Online): 2040-7467
ISSN (Print): 2040-7459 |
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