Research Article | OPEN ACCESS
Continuous-wave Terahertz Imaging Applied to Detect Infestations Caused by Insects in Grain
Zuojun Tan, Jun Lu, Jun Luo and Jing Xie
College of Basic Sciences, Huazhong Agricultural University, Wuhan 430070, P.R. China
Advance Journal of Food Science and Technology 2014 2:271-274
Received: October 25, 2013 | Accepted: November 07, 2013 | Published: February 10, 2014
Abstract
Detection infestations caused by insects in grain are important control measures for ensuring storage longevity, seed quality and food safety. The efficiency of the continuous wave terahertz imaging method to detect infestations caused by insects in wheat kernels was determined in this study. A continuous wave terahertz experimental setup was designed for recording of THz images corresponding to different infestations caused by different life stages of insects. The experimental results indicate that the absorbance is generally highest for un-infested wheat kernels and decreased at later growth stages from THz pseudo-color images. Our study intended to demonstrate how the method of continuous wave Terahertz imaging could be applied to detect Infestations Caused by Insects in Grain.
Keywords:
Detection, infestation, insect, terahertz imaging, wheat grain,
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Competing interests
The authors have no competing interests.
Open Access Policy
This article is distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution, and reproduction in any medium, provided you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made.
Copyright
The authors have no competing interests.
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