Research Article | OPEN ACCESS
Testable Subsystems Generation for Fault Detection and Isolation Using a Structural Matching Rank Algorithm Testability of an Electrical Circuit
Alem Said, Mokhtari Hicham, Ouziala Mahdi and Benazzouz Djamel
Solid Mechanics and Systems Laboratory (LMSS), University M’Hamed Bougara Boumerdes, Algeria
Research Journal of Applied Sciences, Engineering and Technology 2013 24:5657-5664
Received: December 12, 2012 | Accepted: January 21, 2013 | Published: May 30, 2013
Abstract
In this study, an advanced way of dealing with testable subsystems and residual generation for fault detection and isolation based on structural analysis is presented. The developed technique considers execution issues; therefore, it has a more realistic point of view compared to classical structural approaches available in the literature. First, theoretical aspects of structural analysis are considered and introduced. Then the way of incorporating them to test the structural proprieties is explained. Finally, we show how the proposed (upgraded) matching rank algorithm can be used in order to choose the most suited matching that leads to computational sequences and detection tests. The method is demonstrated using an electrical circuit.
Keywords:
Testable subsystems, Structural Analysis, Bipartite graph, Analytic Redundancy Relations ARR, Fault Detection and Isolation FDI,
Competing interests
The authors have no competing interests.
Open Access Policy
This article is distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution, and reproduction in any medium, provided you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made.
Copyright
The authors have no competing interests.
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ISSN (Online): 2040-7467
ISSN (Print): 2040-7459 |
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